Transmission Electron Microscopy of Semiconductor...

Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State (Springer Tracts in Modern Physics)

Andreas Rosenauer
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Kategorije:
Engineering
Godina:
2003
Izdanje:
1
Jezik:
english
Strane:
238
ISBN 10:
3540004149
ISBN 13:
9783540004141
Fajl:
PDF, 13.02 MB
IPFS:
CID , CID Blake2b
english, 2003
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